Joint Project EPP
WP1: Process understanding and parameters for low-damage and selective ablation of thin organic layers of organic electronics (OE) by resonant and two-photon resonant excitation
In AP1, mid-IR laser radiation is used to process, i.e. ablate, modify, etc., thin layers of OE. The excitation is carried out resonantly and selectively on defined bonds of the organic compounds contained in the layers, whereby the molecules are not photoablated and therefore no radicals are formed and thus ablated more gently. The ablation of defined layers is adjusted to the specific material by selecting a suitable wavelength of the mid-IR femtosecond laser radiation. The processes taking place during the laser radiation-matter interaction, as well as the resulting subsequent processes, are detected with temporal and spatial resolution using in-house developed ultrafast diagnostics. The objectives are the determination of process parameters for resonant and two-photon resonant ablation of thin organic layers and the extension of the process understanding of resonant ablation by spatially and time-resolved measurements of the dynamics of ablation. The efficiency and lifetime of organic electronic components, such as OLED (organic light emitting diodes) and OPV (organic photovoltaic) modules, are to be increased by reducing the heat affected zone (HAZ) during laser ablation of thin organic layers. To this end, a new selective and gentle process for ablating thin organic layers using resonant excitation with mid-IR femtosecond laser beams is being developed.